The change in the modulation depth of the interferogram of a three-layer interferometer as a function of the relative displacement of the transmission maxima of the component layers is analyzed experimentally. The fringes are displaced by rotating the interferometer with slightly wedge-shaped layers. The interferogram was recorded photoelectrically by scanning the fringes of equal inclination. The experimental relationship between the contrast of the modulation fringes and the relative displacement leads to the establishment of an analytical equation for the apparatus function of the interferometer.
Department of Optics and Spectroscopy