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Characterization of defects observed in the scanning electron microscope in single -crystal $BaY_2F_8$ used in the vacuum ultraviolet

К.М. Devyatkova, О.N. Ivanova, V.V. Mikhailin, T.B. Uvarova, and S.Р. Chernov

Moscow University Physics Bulletin 1988. 1988. N 6. P. 26

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Annotation

Scanning electron microscopy was used to investigate the structure of single-crystal $BaY_2F_8$. The experirnental results indicate that the structure factor contributes to the optical spectra of the single crystals.

Rissian citation:
К.М. Девяткова, О.Н. Иванова, В.В. Михайлин, Т.В. Уварова, С.П. Чернов.
Характеристика дефектов, наблюдаемых в растровом электронном микроскопе, в монокристаллах $BaY_2F_8$, применяемых в ВУФ диапазоне частот.
Вестн. Моск. ун-та. Сер. 3. Физ. Астрон. 1988. № 6. С. 24.
Authors
К.М. Devyatkova, О.N. Ivanova, V.V. Mikhailin, T.B. Uvarova, and S.Р. Chernov
Chair of Theoretical Physics and Chair of Quantum Radiophysics
Issue 6, 1988

Moscow University Physics Bulletin

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