Annotation
Low-energy electron radiation is shown to bе сараblе of modifying substantially the fluctuation relief of the $Si—SiO_2$ interface and increasing the density of "fluctuational" surface electron states of the interface.
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
S.N. Kozlov and А.Yu. Potapov
Chair of General Physics, Chemistry Department
Chair of General Physics, Chemistry Department