The use of computer-aided analysis of diffraction patterns for the automatization of structural studies of phase transformations

A method has been developed for the calculation of diffraction patterns from a single crystal with second-phase precipitates. The method allows the determination of the lattice parameters, the Bravais lattice type, and the orientation relations between the matrix and precipitation phase lattice from the coordinates of reflections on the X-ray diffraction and electron microdiffraction patterns.