Annotation
The concentration of EL2 centers in unalloyed high-resistance GaAs grown from a melt enriched in Ga was shown to reduce by 50 percent as the atomic fraction of arsenic decreased from 0.5 to 0.454. Thermal annealing increased the concentration of centers 1.6 times.
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
V.A. Morozova$^1$, O.G. Koshelev$^1$, E.P. Veretenkin$^2$, V.N. Gavrin$^2$, Yu.P. Kozlova$^2$, A.V. Markov$^3$, A.Ya. Polyakov$^3$
$^1$Department of Semiconductor Physics, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
$^2$Institute for Nuclear Research, Russian Academy of Sciences, Moscow
$^3$Institute of Chemical Problems of Microelectronics, Moscow
$^1$Department of Semiconductor Physics, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
$^2$Institute for Nuclear Research, Russian Academy of Sciences, Moscow
$^3$Institute of Chemical Problems of Microelectronics, Moscow