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Concentration of EL2 centers in GaAs single crystals grown from melts of various compositions

V.A. Morozova$^1$, O.G. Koshelev$^1$, E.P. Veretenkin$^2$, V.N. Gavrin$^2$, Yu.P. Kozlova$^2$, A.V. Markov$^3$, A.Ya. Polyakov$^3$

Moscow University Physics Bulletin 2001. 56. N 3. P. 81

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Annotation

The concentration of EL2 centers in unalloyed high-resistance GaAs grown from a melt enriched in Ga was shown to reduce by 50 percent as the atomic fraction of arsenic decreased from 0.5 to 0.454. Thermal annealing increased the concentration of centers 1.6 times.

Authors
V.A. Morozova$^1$, O.G. Koshelev$^1$, E.P. Veretenkin$^2$, V.N. Gavrin$^2$, Yu.P. Kozlova$^2$, A.V. Markov$^3$, A.Ya. Polyakov$^3$
$^1$Department of Semiconductor Physics, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
$^2$Institute for Nuclear Research, Russian Academy of Sciences, Moscow
$^3$Institute of Chemical Problems of Microelectronics, Moscow
Issue 3, 2001

Moscow University Physics Bulletin

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