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X-Ray microscopy with extremely asymmetric reflection from a crystal

A.V. Andreev, A.A. Konovko

Moscow University Physics Bulletin 2002. 57. N 5. P. 60

  • Article
Annotation

The feasibility of obtaining a submicron resolution in the X-ray microscope using as an optical element a crystal-monochromator in an extremely asymmetric scheme of diffraction has been demonstrated. The dependence of resolution on unit parameters has been studied. The optimal geometry of the experiment and the wavelengths for obtaining a submicron resolution has been determined.

Authors
A.V. Andreev, A.A. Konovko
Department of General Physics and Wave Processes, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
Issue 5, 2002

Moscow University Physics Bulletin

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