On the contrast of the terrace conductivity of graphite

The recently developed technique of scanning resistance microscopy (SRM) has recommended itself as a high-precision tool for the investigation of surface conductive properties. It is different from conventional atomic-force microscopy in its ability to obtain simultaneous data about both the topography and contact resistance of a probe and sample. This method was used for investigation of the conductive properties of highly oriented pyrolytic graphite (HOPG). A series of experimental facts testifies that the field of application of SRM during the performance of nanoobject research on graphite substrate is restricted by the surface of atomic plateau. This is connected with the fact that during crossing of atomic steps the state of contact of the probe and sample changes, which has a great influence on its conducting properties.