There are no established methods that have a sensitivity during the determination of an adsorbed polymer film mass that is not worse than 1 ng that do not require additional calibration and the usage of reference measures. A highly sensitive method for measuring an adsorbed polymer is proposed in this work. The added mass was determined by the change of the resonance frequency of a cantilever used in atomic-force microscopy (AFM) as a probe. A modification of the cantilever surface is proposed that allows one to avoid the affect of the adsorbed polymer on the cantilever force constant. The mass of poly(diallyldimethylammonium) (PDDA) chloride adsorbed on the cantilever surface was obtained with a sensitivity of 0.01 ng using an AFM cantilever.
Faculty of Physics, Moscow State University, Moscow, Russia
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