Annotation
The quantitative basis of a method of increasing the spatial resolution of a cathodoluminescent image in a scanning electron microscope using a three-dimens ional model is presented. An improvement in resolution by a factor of five is obtained in specimens of CdS and ZnSe semiconductors.
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
G.V. Spivak, L.F. Komolova, G.V. Saparin, V.V. Mazur, and V.A. Cherepenin
Department of Electronics
Department of Electronics