X-Ray identification of the deformation tensor in Bi monocrystals and Bi$_{1-x}$Sb$_x$ $(x \leq 0,1)$ alloys with strong anisotropic deformation in annular rings

All of the components of the tensor of deformation of $\varepsilon_{ij}$ are acquired using a method of X-ray diffractometry at liquid nitrogen temperature and the nature of the stressed state of samples of monocrystalline Bi and Bi$_{1-x}$Sb$_x$ $(x \leq 0,1)$ alloys, deformed in annular rings using a method which has been widely used to create strong anisotropic deformations in semimetals, is determined.