Faculty of Physics
M.V. Lomonosov Moscow State University
Menu
Regular Article

The effect of variation of the refractive index and thickness of layers in thin-layer interference filters on their optical parameters

A.V. Kosar', E.V. Putrina

Moscow University Physics Bulletin 1992. 47. N 5. P. 28

  • Article
Annotation

Changes in the refractive index of a medium to be matched and in the matching wavelength upon variation of the refractive indices and thicknesses of layers in thin-layer interference filters (TIF) were studied theoretically (the optical thickness of the layers is smaller than a quarter wavelength) for TIF with two and three layers in a period. New properties of such filters were discovered, in particular, the invariance of these changes with respect to the number of periods when the refractive indices of the layers vary. Simple analytical expressions were obtained that allow an adequate determination of the shift in the parameters under consideration. A computer-aided numerical analysis confirmed the theoretical predictions.

Authors
A.V. Kosar', E.V. Putrina
Department of Radiophysics, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
Issue 5, 1992

Moscow University Physics Bulletin

Science News of the Faculty of Physics, Lomonosov Moscow State University

This new information publication, which is intended to convey to the staff, students and graduate students, faculty colleagues and partners of the main achievements of scientists and scientific information on the events in the life of university physicists.