The maximum resolving power of a measuring-computer system based on a scanning tunnel microscope (STM) has been investigated in the linear approximation. A sequence of surface classes of increasing dimension is denned. In each of the classes the surface is reconstructed with maximum accuracy from STM measurement data. The dependence of the error in the reconstruction of the surface coordinates on the noise-to-signal ratio is determined. The conditions are found for an optimal discretization of STM measurements that provides maximum accuracy in the reconstruction of measured surface.
Department of Computer Methods of Physics, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
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