Annotation
The present paper considers the possibility of using the spectrophotometric method for studying the thin films inhomogeneity. А hierarchic approach to the construction of mathematical models of investigation of thin films is put forward.
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
Yu.A. Bobrovnikov, A.V. Kozar', K.V. Popov, A.N. Tikhonov, A.V. Tikhonravov, and М.К. Тrubetskov
Department of Mathematics
Department of Mathematics
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