Annotation
A method for rapidly determining the thickness of nanometer dielectric films accurate to $\pm$2-3 nm is suggested. The method is a modification of the ellipsometric method and is based on Brewster angle measurements for light passing through film-substrate systems. The results are used in experiments on effective generation of soft X-rays in dangling superthin films exposed to $10^{16}$ W /cm$^2$ laser pulses.
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
V.M. Gordienko, A.B. Savel'ev, A.A. Shashkov
Department of General Physics and Wave Processes, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
Department of General Physics and Wave Processes, Faculty of Physics, Moscow State University, Leninskie Gory, Moscow, 119992, Russia
Science News of the Faculty of Physics, Lomonosov Moscow State University
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