Method of determination of radioactivity and particle parameters by semiconductor detector systems

Method has been presented for simultaneous and separate determination of spectral and dose characteristics of $\alpha$-, $\beta$-, and $\gamma$-radiation, low-energy particle parameters, as well as for determination of the radionuclide type in the substance under study. The method is based on measuring the specific energy loss $\Delta E$ of a particle simultaneously with measuring energy $E$ by semiconductor detectors, and also by prograI11mable memory devices for storage of preliminarily calculated dependencies $\Delta E(E)$ for each type of particles and further comparison with measurements.