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Calculation of the contribution of conduction electrons to the atomic factors of simple metals

O.V. Kris’ko, V.M. Silonov, T.V. Skorobogatova, D.A. Kireev

Moscow University Physics Bulletin 2007. 62. N 4. P. 240

  • Article
Annotation

An expression for the Fourier transform of the screening electron density of simple metals has been derived using smooth nonlocal model potentials of simple metals. The expression describes the contribution of conduction electrons to the atomic factors of X-ray scattering in simple metals. Aluminum was used as an example for numerical checking. Comparison with the results of similar calculations for the form factor of the Krasko-Gurskii model potential shows the importance of taking the nonlocality of the model potential into account.

Authors
O.V. Kris’ko, V.M. Silonov, T.V. Skorobogatova, D.A. Kireev
Moscow State University, Leninskie gory, Moscow, 119992, Russia
Issue 4, 2007

Moscow University Physics Bulletin

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