The combined method of static and dynamic magnetic measurements is used to study nano-dimensional multilayer amorphous CoFeZr/α -Si films. It is established that at the thickness of magnetic layers x = 5–12 nm their magnetization does not differ from that of the bulk material. It is shown that as x is lowered to 2–3 nm, the magnetization of magnetic layers decreases, which may be due to the formation of mixed layers containing nonmagnetic silicides. At a thickness of nonmagnetic interlayers of less than 1 nm the features characteristic of a weak antiferromagnetic interaction of neighboring layers are observed.
$^1$Kuban’ State University, Kuban, Russia
$^2$Voronezh State Technical University, Voronezh, Russia
$^3$Department of Radiophysics, Faculty of Physics, Moscow State University, Moscow, 119991, Russia
$^4$National State University Khar’kovskii Politekhnicheskii Institut, Khar’kovskii, Russia
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