Annotation
In this work we describe a method for evaluating such parameters of an interfacial layer as the refractive index and thickness of the liquid–vapor interface, based on the measured ellipticity coefficient, ρ, at different wavelengths of the probing light and the data [1] for several pure fluids. In particular, the change in the main angle of incidence was evaluated in the <<layer on the substrate>> structure. The surface layer is assumed to be homogeneous.
Received: 2015 February 11
Approved: 2016 April 18
PACS:
64.60.A- Specific approaches applied to studies of phase transitions
© 2016 Publisher M.V.Lomonosov Moscow State University
Authors
S.G.Ili'ina, E.A. Alexeeva
Department of Physics, Moscow State University, Moscow, 119991 Russia
Department of Physics, Moscow State University, Moscow, 119991 Russia
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