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Influence of low- energy electron irradiation оn the fluctuational relief of the Si-Si02 interface

S.N. Kozlov and А.Yu. Potapov

Moscow University Physics Bulletin 1989. 1989. N 2. P. 78

  • Article
Annotation

Low-energy electron radiation is shown to bе сараblе of modifying substantially the fluctuation relief of the $Si—SiO_2$ interface and increasing the density of "fluctuational" surface electron states of the interface.

Authors
S.N. Kozlov and А.Yu. Potapov
Chair of General Physics, Chemistry Department
Issue 2, 1989

Moscow University Physics Bulletin

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