An analysis of the influence of standing waves on the angular dependencies of the fluorescent yield from an ultrathin iron layer buried inside a multilayer structure of Nb(50 nm)/Fe(3.9 nm)/[Si/Mo(6.77 nm)]$_{40}$/SiO$_2$ is presented. These angular dependencies of reflectivity and FeK α-fluorescence yield were measured at the Station for high-precision X-ray optics (HPXO) of the Kurchatov Center for Synchrotron Radiation and Nanotechnology. The measured data was analyzed with the help of our FLUO software package. As a result of the complex treatment of reflectivity and Fe fluorescent yield data, the depth profile for iron atomic density was restored.
68.65.Ac Multilayers
78.70.En X-ray emission spectra and fluorescence
$^1$Faculty of Physics, Solid State Physics Department, Moscow State University, Leninskiye Gory, Moscow, 119991, Russia.
$^2$Russian Research Centre Kurchatov Institute, pl. Kurchatova 1, Moscow, 123182, Russia
Science News of the Faculty of Physics, Lomonosov Moscow State University
This new information publication, which is intended to convey to the staff, students and graduate students, faculty colleagues and partners of the main achievements of scientists and scientific information on the events in the life of university physicists.